Measurements of atomic ordering in roughness with grazing incidence X-ray diffraction
نویسندگان
چکیده
منابع مشابه
Grazing-Incidence X-Ray Diffraction
Contents 1. Geometry of GID 2. Typical applications 3. Experimental setups 4. Kinematical vs dynamical theory 5. GID in multilayers and matrix dynamical theory 6. Diffuse scattering in GID
متن کاملGrazing Incidence In-plane X-ray Diffraction in the Laboratory
The laboratory implementation of grazing incidence in-plane X-ray diffraction, using an unmodified commercial diffractometer, is described. Low resolution, high intensity measurements are illustrated in the study of the in-plane lattice parameters and texture of a thin polycrystalline ZnO film on glass, the in-plane order in Cd arachidate Langmuir-Blodgett films, and the depth dependence of lat...
متن کاملProtegrin interaction with lipid monolayers: Grazing incidence X-ray diffraction and X-ray reflectivity study.
Interactions of the antimicrobial peptide protegrin-1 (PG-1) with phospholipid monolayers have been investigated by using grazing incidence X-ray diffraction (GIXD) and specular X-ray reflectivity (XR). The structure of a PG-1 film at the air-aqueous interface was also investigated by XR for the first time. Lipid A, dipalmitoyl-phosphatidylglycerol (DPPG) and dipalmitoyl-phosphatidylcholine (DP...
متن کاملDensity dependent composition of InAs quantum dots extracted from grazing incidence x-ray diffraction measurements
Epitaxial InAs quantum dots grown on GaAs substrate are being used in several applications ranging from quantum communications to solar cells. The growth mechanism of these dots also helps us to explore fundamental aspects of self-organized processes. Here we show that composition and strain profile of the quantum dots can be tuned by controlling in-plane density of the dots over the substrate ...
متن کاملGrazing Incidence X-ray Measurement of Interface Roughness in Sputtered Cu/Co Multilayers
We report grazing incidence X-ray scattering and high angle X-ray diffraction measurements of the structure of sputtered Cu/Co multilayers. Compared with structures grown by molecular beam epitaxy (MBE) the roughness at the Cu/Co interfaces has little conformality and is almost uncorrelated between the bottom and the top. The lateral correlation length is short in comparison with the MBE materi...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography
سال: 1996
ISSN: 0108-7673
DOI: 10.1107/s0108767396080622